Semiconductor devices - Mechanical and climatic test methods – Part 23: High temperature operating life

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Hardcopy , PDF

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English

Published date

01-03-2026

Publisher

Comitato Elettrotecnico Italiano

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This part of IEC 60749 specifies the test used to determine the effects of bias conditions and
temperature on solid state devices over time.

Committee	CT 309
DocumentType	Test Method
ISBN	978-2-8327-0903-0
Pages	16
PublisherName	Comitato Elettrotecnico Italiano
Status	Current
Supersedes	CEI EN 60749-23 : 2006 CEI EN 60749-23/A1 : 2012

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CEI EN IEC 60749-23:2026