Name: CEI EN IEC 60749-26:2026 - Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM)
Brand: Comitato Elettrotecnico Italiano

Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM)

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Published date

01-04-2026

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Comitato Elettrotecnico Italiano

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This part of IEC 60749 establishes the procedure for testing, evaluating, and classifying components and microcircuits in accordance with their susceptibility (sensitivity) to damage or degradation by exposure to a defined human body model (HBM) electrostatic discharge (ESD).

Committee	CT 309
DocumentType	Test Method
ISBN	978-2-8327-0918-4
Pages	58
ProductNote	This standard is also refers to ANSI/ESD SP5.0
PublisherName	Comitato Elettrotecnico Italiano
Status	Current
Supersedes	CEI EN IEC 60749-26:2018

Standards	Relationship
IEC 60749-26:2025	Identical
EN IEC 60749-26:2026	Identical

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CEI EN IEC 60749-26:2026

Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM)

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