Name: CEI EN IEC 60749-30:2021-06 - Semiconductor devices - Mechanical and climatic test methods Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing
Brand: Comitato Elettrotecnico Italiano

Semiconductor devices - Mechanical and climatic test methods Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing

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English

Published date

01-06-2021

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Comitato Elettrotecnico Italiano

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. The standard in question completely replaces the CEI EN 60749-30:2005-07 standard, which remains applicable until 22-09-2023.

Committee	CT 309
DocumentType	Standard
ISBN	978-2-8322-8669-2
Pages	22
PublisherName	Comitato Elettrotecnico Italiano
Status	Current
Supersedes	CEI EN 60749-30 : 2005 CEI EN 60749-30/A1:2012

Standards	Relationship
IEC 60749-30:2020	Identical
EN IEC 60749-30:2020	Identical

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CEI EN IEC 60749-30:2021-06

Semiconductor devices - Mechanical and climatic test methods Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing

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