CEI EN IEC 60749-5:2024
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Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test
Available format(s)
Hardcopy , PDF
Language(s)
English
Published date
01-04-2024
Publisher
This part of IEC 60749 provides a steady-state temperature and humidity bias life test to evaluate the reliability of non-hermetic packaged semiconductor devices in humid environments.
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