Semiconductor devices - Guidelines for reliability qualification plans Part 2: Concept of mission profile

Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

01-09-2023

Publisher

Comitato Elettrotecnico Italiano

This part of IEC 63287 gives guidelines for the development of reliability qualification plans using the concept of mission profile, based on the environmental conditioning and proposed usage of the product.

Committee	CT 309
DocumentType	Standard
ISBN	978-2-8322-6708-0
Pages	24
PublisherName	Comitato Elettrotecnico Italiano
Status	Current

Standards	Relationship
EN IEC 63287-2:2023	Identical
IEC 63287-2:2023	Identical

IECQ 03-5:2017	IEC Quality Assessment System for Electronic Components (IECQ System) - Rules of Procedure - Part 5: IECQ HSPM Scheme - Hazardous Substance Process Management Requirements
IECQ 01A:2011	IEC Quality Assessment System for Electronic Components (IECQ System) - IECQ Guide - Guidance for the use of the IECQ Logo and IECQ Mark of Conformity

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CEI EN IEC 63287-2:2023

Semiconductor devices - Guidelines for reliability qualification plans Part 2: Concept of mission profile

Abstract

General Product Information

International Equivalents

Standards Referencing This Book

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