Process management for avionics. Atmospheric radiation effects Guidelines for single event effects testing for avionics systems

Available format(s)

Hardcopy , PDF

Superseded date

31-10-2008

Language(s)

English

Published date

31-12-2007

Publisher

British Standards Institution

Committee	GEL/107
DocumentType	Standard
Pages	24
PublisherName	British Standards Institution
Status	Superseded
SupersededBy	DD IEC/TS 62396-2:2008

Provides guidance related to the testing of microelectronic devices for purposes of measuring their susceptibility to single event effects (SEE) induced by the atmospheric neutrons. Also shows how the test data can be used to estimate the SEE rate of devices and boards due to the atmospheric neutrons in the atmosphere at aircraft altitudes.

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DD IEC/PAS 62396-2:2007

Process management for avionics. Atmospheric radiation effects Guidelines for single event effects testing for avionics systems

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