DD IEC TS 62396-1 : DRAFT JUL 2006
Withdrawn
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PROCESS MANAGEMENT FOR AVIONICS - ATMOSPHERIC RADIATION EFFECTS - PART 1: ACCOMMODATION OF ATMOSPHERIC RADIATION EFFECTS VIA SINGLE EVENT EFFECTS WITHIN AVIONICS ELECTRONIC EQUIPMENT
27-10-2018
23-11-2012
FOREWORD
INTRODUCTION
1 Scope and object
2 Normative references
3 Terms and definitions
4 Abbreviations used in the document
5 Radiation environment of the atmosphere
5.1 Radiation generation
5.2 Effect of secondary particles on avionics
5.3 Atmospheric neutrons
5.4 Secondary protons
5.5 Other particles
5.6 Solar enhancements
6 Effects of atmospheric radiation on avionics
6.1 Types of radiation effects
6.2 Single event effects
6.3 Total Ionising Dose (TID)
6.4 Displacement damage
7 Guidance for system designs
7.1 Overview
7.2 System design
7.3 Hardware considerations
7.4 Parts characterisation and control
8 Determination of avionics single event effects rates
8.1 Main single event effects
8.2 Single event effects with lower event rates
8.3 Single event effects with higher event rates -
Single event upset data
8.4 Calculating SEE rates in avionics
9 Considerations for SEE compliance
9.1 Compliance
9.2 Confirm the radiation environment for the
avionics application
9.3 Identify system development assurance level
9.4 Assess preliminary electronic equipment design
for SEE
9.5 Verify that the system development assurance level
requirements are met for SEE
9.6 Corrective actions
Annex A (informative) Thermal neutron assessment
Annex B (informative) Methods of calculating SEE rates
in avionics electronics
Annex C (informative) Review of test facility availability
Annex D (informative) Tabular description of variation of
atmospheric neutron flux with altitude and
latitude
Specifies the radiation environment, the effects of that environment on electronics and provides design considerations for the accommodation of those effects within avionics systems.
Committee |
GEL/107
|
DocumentType |
Draft
|
PublisherName |
British Standards Institution
|
Status |
Withdrawn
|
SupersededBy |
Standards | Relationship |
IEC TS 62396-1:2006 | Identical |
MIL-STD-883 Revision K:2016 | TEST METHOD STANDARD - MICROCIRCUITS |
SAE ARP 4754 : 2010 | GUIDELINES FOR DEVELOPMENT OF CIVIL AIRCRAFT AND SYSTEMS |
MIL-PRF-19500 Revision P:2010 | SEMICONDUCTOR DEVICES, GENERAL SPECIFICATION FOR |
SAE ARP 4761 : 1996 | GUIDELINES AND METHODS FOR CONDUCTION THE SAFETY ASSESSMENT PROCESS ON CIVIL AIRBORNE SYSTEMS AND EQUIPMENT |
FAA AC 23.1309-1 : 2011 | SYSTEM SAFETY ANALYSIS AND ASSESSMENT FOR PART 23 AIRPLANES |
FAA AC 25.1309-1 : 0 | SYSTEM DESIGN AND ANALYSIS |
MIL-PRF-38535 Revision K:2013 | Integrated Circuits (Microcircuits) Manufacturing, General Specification for |
AIAA R 100 : A 2001 | RECOMMENDED PRACTICE FOR PARTS MANAGEMENT |
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