Process management for avionics. Atmospheric radiation effects Guidelines for single event effects testing for avionics systems

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Hardcopy , PDF

Superseded date

31-08-2014

Language(s)

English

Published date

31-10-2008

Publisher

British Standards Institution

Committee	GEL/107
DocumentType	Standard
Pages	0
PublisherName	British Standards Institution
Status	Superseded
SupersededBy	BS IEC 62396-2:2012
Supersedes	DD IEC/PAS 62396-2:2007

IEC TS 62396-2:2008 (E) provides guidance related to the testing of microelectronic devices for purposes of measuring their susceptibility to single event effects (SEE) induced by the atmospheric neutrons. Since the testing can be performed in a number of different ways, using different kinds of radiation sources, it also shows how the test data can be used to estimate the SEE rate of devices and boards due to the atmospheric neutrons in the atmosphere at aircraft altitudes.

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DD IEC/TS 62396-2:2008

Process management for avionics. Atmospheric radiation effects Guidelines for single event effects testing for avionics systems

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