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DD IEC/TS 62396-2:2008

Superseded

Superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

View Superseded by

Process management for avionics. Atmospheric radiation effects Guidelines for single event effects testing for avionics systems

Available format(s)

Hardcopy , PDF

Superseded date

31-08-2014

Superseded by

BS IEC 62396-2:2012

Language(s)

English

Published date

31-10-2008

€243.07
Excluding VAT

Committee
GEL/107
DocumentType
Standard
Pages
0
PublisherName
British Standards Institution
Status
Superseded
SupersededBy
Supersedes

IEC TS 62396-2:2008 (E) provides guidance related to the testing of microelectronic devices for purposes of measuring their susceptibility to single event effects (SEE) induced by the atmospheric neutrons. Since the testing can be performed in a number of different ways, using different kinds of radiation sources, it also shows how the test data can be used to estimate the SEE rate of devices and boards due to the atmospheric neutrons in the atmosphere at aircraft altitudes.

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