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DEFSTAN 00-53/2(1999) : 1999

Superseded

Superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

View Superseded by

SAFE OPERATING LIMITS FOR BACKDRIVING

Available format(s)

Hardcopy , PDF

Superseded date

31-10-2007

Language(s)

English

Published date

01-01-1999

€14.02
Excluding VAT

Preface
Section One. General
0 Introduction
1 Scope
2 Further Reading
3 Definitions
Section Two. Guide to In-Circuit Testing
4 Overview
5 Testers
6 Backdriving
7 Danger Mechanisms
Section Three. Backdriving Limits
8 Detailed Requirements
9 Backdriving Condition
10 Pulse Duration
11 General Conditions
12 Bondwire Temperature Rise
Annex A Relationship of Backdriving Current/Pulse Length in Aluminium
        Bondwire in Hollow Packages
Annex B Relationship of Backdriving Current/Pulse Duration in Gold
        Bondwires in Plastic Packages
Annex C Relationship of Backdriving Current/Pulse Duration in Gold
        Bondwires in Hollow Packages
Annex D The Calculation of the Temperature Rise in Bond Wires due to
        Time Varying Currents

Contains requirements for in-circuit testing when used to test electronic components on a panel electronic circuit (PEC), using node forcing techniques such that one or more integrated circuits on PEC under test are subjected to Backdriving.

DevelopmentNote
Supersedes DEFSTAN 00-53/1(1991) (06/2003)
DocumentType
Standard
Pages
24
PublisherName
UK Ministry of Defence Standards
Status
Superseded
SupersededBy
Supersedes

DEFSTAN 00-13/3(1994) : 1994 REQUIREMENTS FOR THE ACHIEVEMENT OF TESTABILITY IN ELECTRONIC AND ALLIED EQUIPMENT
DEFSTAN 00-13(PT2)/1(1978) : 1978 ACHIEVEMENT OF TESTABILITY IN ELECTRONIC AND ALLIED EQUIPMENT - PART 2: PRODUCTION ACCEPTANCE TESTING
DEFSTAN 00-10/3(1986) : 1986 AMD 2 1993 GENERAL DESIGN AND MANUFACTURING REQUIREMENTS FOR SERVICE ELECTRONIC EQUIPMENT
DEFSTAN 00-13(PT1)/1(1981) : LATEST REQUIREMENTS FOR THE ACHIEVEMENT OF TESTABILITY IN ELECTRONIC AND ALLIED EQUIPMENT

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