DEFSTAN 00-53/2(1999) : 1999
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
View Superseded by
SAFE OPERATING LIMITS FOR BACKDRIVING
Hardcopy , PDF
31-10-2007
English
01-01-1999
Preface
Section One. General
0 Introduction
1 Scope
2 Further Reading
3 Definitions
Section Two. Guide to In-Circuit Testing
4 Overview
5 Testers
6 Backdriving
7 Danger Mechanisms
Section Three. Backdriving Limits
8 Detailed Requirements
9 Backdriving Condition
10 Pulse Duration
11 General Conditions
12 Bondwire Temperature Rise
Annex A Relationship of Backdriving Current/Pulse Length in Aluminium
Bondwire in Hollow Packages
Annex B Relationship of Backdriving Current/Pulse Duration in Gold
Bondwires in Plastic Packages
Annex C Relationship of Backdriving Current/Pulse Duration in Gold
Bondwires in Hollow Packages
Annex D The Calculation of the Temperature Rise in Bond Wires due to
Time Varying Currents
Contains requirements for in-circuit testing when used to test electronic components on a panel electronic circuit (PEC), using node forcing techniques such that one or more integrated circuits on PEC under test are subjected to Backdriving.
DevelopmentNote |
Supersedes DEFSTAN 00-53/1(1991) (06/2003)
|
DocumentType |
Standard
|
Pages |
24
|
PublisherName |
UK Ministry of Defence Standards
|
Status |
Superseded
|
SupersededBy | |
Supersedes |
DEFSTAN 00-13/3(1994) : 1994 | REQUIREMENTS FOR THE ACHIEVEMENT OF TESTABILITY IN ELECTRONIC AND ALLIED EQUIPMENT |
DEFSTAN 00-13(PT2)/1(1978) : 1978 | ACHIEVEMENT OF TESTABILITY IN ELECTRONIC AND ALLIED EQUIPMENT - PART 2: PRODUCTION ACCEPTANCE TESTING |
DEFSTAN 00-10/3(1986) : 1986 AMD 2 1993 | GENERAL DESIGN AND MANUFACTURING REQUIREMENTS FOR SERVICE ELECTRONIC EQUIPMENT |
DEFSTAN 00-13(PT1)/1(1981) : LATEST | REQUIREMENTS FOR THE ACHIEVEMENT OF TESTABILITY IN ELECTRONIC AND ALLIED EQUIPMENT |
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