DEFSTAN 00-53/3(2007) : 2007
Withdrawn
A Withdrawn Standard is one, which is removed from sale, and its unique number can no longer be used. The Standard can be withdrawn and not replaced, or it can be withdrawn and replaced by a Standard with a different number.
SAFE OPERATING LIMITS FOR BACKDRIVING
Hardcopy , PDF
08-03-2017
English
01-01-2007
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Foreword
Introduction
1 Scope
2 Warning
3 Abbreviations & Definitions
4 Guide to In-Circuit Testing
4.1 Overview
4.2 Testers
4.3 Backdriving
4.4 Damage Mechanisms
5 Backdriving Limits
5.1 Detailed Requirements
5.2 Backdriving Conditions
5.3 Pulse Duration
5.4 General Conditions
5.5 Bondwire Temperature Rise
6 Relationship between Backdriving Current & Pulse Duration
6.1 Aluminium Bondwires in hollow packages
6.2 Gold Bondwires in plastic packages
6.3 Gold Bondwires in hollow packages
7 Calculation of Temperature Rise in Bondwires
7.1 Heating due to Current
Annex A Definitions and Abbreviations
A.1 Definitions
A.2 Abbreviations
A.3 IC Types and Families
Annex B Bibliography
Provides requirements for in-circuit testing when used to test electronic components on a panel, electronic circuit (PEC), using node forcing techniques such that one or more integrated circuits on the PEC under test are subjected to backdriving.
| DevelopmentNote |
Supersedes DEFSTAN 00-53/2(1999). (11/2007) This standard is obsolescent because it is no longer required for the procurement of new equipment but is retained for maintenance purposes in support of existing in-service equipment. (01/2012)
|
| DocumentType |
Standard
|
| Pages |
24
|
| PublisherName |
UK Ministry of Defence Standards
|
| Status |
Withdrawn
|
| Supersedes |
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