• DIN 40046-10 : 1972

    Superseded A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

    ENVIRONMENTAL TESTING FOR ELECTRICAL EQUIPMENT - TEST J: MOULD GROWTH

    Available format(s): 

    Superseded date:  01-04-1991

    Language(s): 

    Published date:  12-01-2013

    Publisher:  German Institute for Standardisation (Deutsches Institut für Normung)

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    Table of Contents - (Show below) - (Hide below)

    1 Allgemeine Angaben
    2 Zweck der Prüfung
    3 Prüfmittel
      3.1 Prüfpilze
      3.2 Gewinnen der Sporenaufschwemmung
      3.3 Kontrolle der Pilze
      3.4 Kulturbedingungen
    4 Einrichtungen für die Prüfbeanspruchung
      4.1 Kleine Prüflinge
      4.2 Grosse Prüflinge
    5 Vorbehandlung und Anfangsmessungen
    6 Beanspruchung
    7 Endmessungen und Beurteilungen
      7.1 Sichtkontrolle
      7.2 Auswirkungen des Pilzbewuchses
      7.3 Beurteilung des Pilzbewuchses
    8 Angaben, die in den Einzelbestimmungen festgelegt
      werden müssen
    Anhang A: Leitfaden zur Prüfung J
    A1 Allgemeines
    A2 Keimung und Wachstum
    A3 Wirkungen des Schimmelpilzbewuchses
    A4 Massnahmen gegen Schimmelpilzwachsturn
    A5 Anwendbarkeit der Prüfung J
    A6 Gefahr für das Bedienungspersonal
    A7 Anwendung von Fungiziden
    Anmerkungen: Fungizide Anstriche

    General Product Information - (Show below) - (Hide below)

    Development Note partly superseded by the Nov86 version of DIN IEC 68 PT2-10, & fully superseded by its Apr91 version.
    Document Type Standard
    Publisher German Institute for Standardisation (Deutsches Institut für Normung)
    Status Superseded
    Superseded By

    Standards Referenced By This Book - (Show below) - (Hide below)

    DIN 41616-4:1978-07 LINK AND TEST CONNECTOR FOR PRINTED BOARDS; RATINGS, REQUIREMENTS, TEST SCHEDULES
    DIN 45175-3:1987-05 QUARTZ CRYSTAL CONTROLLED OSCILLATORS; CHARACTERISTICS OF QUARTZ CRYSTAL CONTROLLED OSCILLATORS; CHECK LIST
    DIN 45174-2:1987-05 QUARTZ CRYSTAL CONTROLLED OSCILLATORS; TEST CONDITIONS AND METHODS
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