DIN 50440-1:1981-11
Superseded
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
View Superseded by
TESTING OF MATERIALS FOR SEMICONDUCTOR TECHNOLOGY; MEASUREMENT OF RECOMBINATION CARRIER LIFETIME IN SILICON SINGLE CRYSTALS BY MEANS OF PHOTO CONDUCTIVE DECAY METHOD; MEASUREMENT ON BAR SHAPED SPECIMENS
Superseded date
01-11-1998
Superseded by
Published date
12-01-2013
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| DocumentType |
Standard
|
| PublisherName |
German Institute for Standardisation (Deutsches Institut für Normung)
|
| Status |
Superseded
|
| SupersededBy |
| ASTM F 1535 : 2000 | Standard Test Method for Carrier Recombination Lifetime in Silicon Wafers by Noncontact Measurement of Photoconductivity Decay by Microwave Reflectance (Withdrawn 2003) |
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