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DIN 50441-4:1999-03

Withdrawn

Withdrawn

A Withdrawn Standard is one, which is removed from sale, and its unique number can no longer be used. The Standard can be withdrawn and not replaced, or it can be withdrawn and replaced by a Standard with a different number.

TESTING OF MATERIALS FOR SEMICONDUCTOR TECHNOLOGY - DETERMINATION OF THE GEOMETRIC DIMENSIONS OF SEMICONDUCTOR WAFERS - PART 4: SLICE DIAMETER, DIAMETER VARIATION, FLAT DIAMETER, FLAT LENGTH, FLAT DEPTH

Available format(s)

Hardcopy , PDF

Withdrawn date

01-01-2009

Language(s)

English

Published date

12-01-2013

Gives methods for measuring the diameter, variations in diameter, and flat diameter, depth and length of circular semi-conductor wafers.

DocumentType
Standard
Pages
10
PublisherName
German Institute for Standardisation (Deutsches Institut für Normung)
Status
Withdrawn

DIN 50441-2:1998-11 TESTING OF MATERIALS FOR SEMICONDUCTOR TECHNOLOGY - DETERMINATION OF THE GEOMETRIC DIMENSIONS OF SEMICONDUCTOR WAFERS - PART 2: TESTING OF EDGE PROFILE
DIN 50441-1:1996-07 TESTING OF MATERIALS FOR SEMICONDUCTOR TECHNOLOGY - DETERMINATION OF THE GEOMETRIC DIMENSIONS OF SEMICONDUCTOR WAFERS - PART 1: THICKNESS AND THICKNESS VARIATION

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