DIN EN 60512-25-3:2002-08
Current
The latest, up-to-date edition.
CONNECTORS FOR ELECTRONIC EQUIPMENT - TESTS AND MEASUREMENTS - PART 25-3: TEST 25C: RISE TIME DEGRADATION
Hardcopy , PDF
German
01-01-2002
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1 General
1.1 Scope and object
1.2 Definitions
2 Test resources
2.1 Equipment
2.2 Fixture
2.2.1 Method A, single-ended
2.2.2 Method B, differentially driven
3 Test specimen
3.1 Description
3.1.1 Separable connectors
3.1.2 Cable assembly
3.1.3 Sockets
4 Test procedure
4.1 Insertion technique
4.2 Reference fixture technique
4.3 Rise time degradation calculation
5 Details to be specified
6 Test documentation
Annex A (normative) - Diagrams and schematics of
fixtures and equipment
Annex B (informative) - Practical guidance
Figure 1 - Waveform
Figure A.1 - Technique diagrams
Figure A.2 - Single-ended terminations
Figure A.3 - Differential (balanced) terminations
Specifies a method for measuring the effect a specimen has on the rise time of a signal passing through it.
| DevelopmentNote |
Supersedes DIN IEC 48B-780-CD (08/2002)
|
| DocumentType |
Standard
|
| Pages |
13
|
| PublisherName |
German Institute for Standardisation (Deutsches Institut für Normung)
|
| Status |
Current
|
| Standards | Relationship |
| BS EN 60512-25-3:2001 | Identical |
| UNE-EN 60512-25-3:2002 | Identical |
| NF EN 60512-25-3 : 2002 | Identical |
| IEC 60512-25-3:2001 | Identical |
| I.S. EN 60512-25-3:2001 | Identical |
| EN 60512-25-3:2001 | Identical |
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