DIN EN 60749-29:2012-01

1 Scope and object
2 Terms and definitions
3 Apparatus and material
  3.1 Latch-up tester
  3.2 Automated test equipment (ATE)
  3.3 Heat source
4 Procedure
  4.1 General latch-up test procedure
  4.2 Detailed latch-up test procedure
5 Failure criteria
6 Summary
Figure 1 - V[supply] qualification circuit
Figure 2 - Trigger source qualification circuit
Figure 3 - Latch-up test flow
Figure 4 - Test waveform for positive I-test
Figure 5 - Test waveform for negative I-test
Figure 6 - Test waveform for V[supply] overvoltage
Figure 7 - Equivalent circuit for positive input/output I-test
           latch-up testing
Figure 8 - Equivalent circuit for negative input/output I-test
           latch-up testing
Figure 9 - Equivalent circuit for V[supply] overvoltage test
           latch-up testing
Table 1 - Test matrix
Table 2 - Timing specifications for I-test and V[supply]
          overvoltage test