SEMICONDUCTOR DEVICES - MICRO-ELECTROMECHANICAL DEVICES - PART 17: BULGE TEST METHOD FOR MEASURING MECHANICAL PROPERTIES OF THIN FILMS (IEC 62047-17:2015)

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Hardcopy , PDF

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German

Published date

01-01-2015

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€111.37

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DocumentType	Standard
Pages	28
PublisherName	German Institute for Standardisation (Deutsches Institut für Normung)
Status	Current

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ChatGPT Perplexity

€111.37

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DIN EN 62047-17:2015-12