Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock - Device and subassembly (IEC 60749-10:2022); German version EN IEC 60749-10:2022

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German

Published date

01-12-2023

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DocumentType	Standard
Pages	15
PublisherName	German Institute for Standardisation (Deutsches Institut für Normung)
Status	Current
Supersedes	DIN EN 60749-10:2003-04 DIN EN IEC 60749-10:2023-06 (Draft)

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DIN EN IEC 60749-10:2023-12