Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing (IEC 60749-30:2020); German version EN IEC 60749-30:2020

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German

Published date

01-02-2023

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DocumentType	Standard
Pages	17
PublisherName	German Institute for Standardisation (Deutsches Institut für Normung)
Status	Current
Supersedes	DIN EN 60749-30:2011-12

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DIN EN IEC 60749-30:2023-02