DIN IEC 62416:2007-08 (Draft)
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
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HOT CARRIER TEST ON MOS TRANSISTORS
01-12-2010
12-01-2013
Dieses Dokument legt das Hot-Carrier-Prüfverfahren für NMOS- und PMOS-Transistoren auf Waferniveau fest. Die Prüfung wurde erarbeitet, um zu ermitteln, inwiefern die einzelnen Transistoren eines bestimmten (C)MOS-Prozesses der geforderten Hot-Carrier-Lebensdauer entsprechen.
| DocumentType |
Draft
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| PublisherName |
German Institute for Standardisation (Deutsches Institut für Normung)
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| Status |
Superseded
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| SupersededBy |
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