DIN PAS 1022 : 2004
Current
Current
The latest, up-to-date edition.
REFERENCE PROCEDURE FOR THE DETERMINATION OF OPTICAL AND DIELECTRIC MATERIAL PROPERTIES AND THE LAYER THICKNESS OF THIN FILMS BY ELLIPSOMETRY
Published date
12-01-2013
| DocumentType |
Standard
|
| PublisherName |
German Institute for Standardisation (Deutsches Institut für Normung)
|
| Status |
Current
|
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