DIN V VDE V 0126-18-4-2 : 2007
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
View Superseded by
SOLAR WAFERS - PART 4-2: PROCESS FOR MEASURING THE ELECTRICAL CHARACTERISTICS OF SILICON - MINORITY CARRIER LIFETIME, LABORATORY MEASURING METHOD
01-12-2009
12-01-2013
Das Verfahren nach dieser Norm dient dazu, die effektive Lebensdauer von optisch erzeugten Überschussladungsträgern als effektive Minoritätsladungsträgerlebensdauer von kristallinen Siliciumscheiben zu bestimmen. Die Methode wird für Messungen in der Fertigungslinie (Inline) empfohlen.
| DocumentType |
Standard
|
| PublisherName |
Verband Deutscher Elektrotechniker
|
| Status |
Superseded
|
| SupersededBy |
| Standards | Relationship |
| VDE 0126-18-4-2 : 2007 | Identical |
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