DS/EN IEC 60749-24:2026
Current
Current
The latest, up-to-date edition.
Semiconductor devices – Mechanical and climatic test methods – Part 24: Accelerated moisture resistance – Unbiased HAST
Published date
23-01-2026
Publisher
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IEC 60749-24:2025 specifies unbiased highly accelerated stress testing (HAST). HAST is performed for the purpose of evaluating the reliability of non-hermetically packaged solid-state devices in humid environments.
| Committee |
DS/V-001
|
| DocumentType |
Standard
|
| PublisherName |
Danish Standards
|
| Status |
Current
|
| Supersedes |
| Standards | Relationship |
| IEC 60749-24:2025 | Identical |
| EN IEC 60749-24:2026 | Identical |
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