DS/EN IEC 62819:2023/AC:2024
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Live working – Eye, face and head protectors against the effects of electric arc – Performance requirements and test methods
Amendment of
Published date
26-03-2024
Publisher
This part of IEC 63275-1 gives a test method to evaluate gate threshold voltage shift of silicon carbide (SiC) power metal-oxide-semiconductor field-effect transistors (MOSFETs) using room temperature readout after applying continuous positive gate-source voltage stress at elevated temperature.
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