DS/EN IEC 63287-2:2023
Current
Current
The latest, up-to-date edition.
Semiconductor devices – Guidelines for reliability qualification plans – Part 2: Concept of mission profile
Published date
25-05-2023
Publisher
This part of IEC 63287 gives guidelines for the development of reliability qualification plans using the concept of mission profile, based on the environmental conditioning and proposed usage of the product.
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