DS/ISO/TS 11353:2026
Current
The latest, up-to-date edition.
Nanotechnologies – A test method for detection of nano-object(s) release from mask media
20-01-2026
This document specifies a test method for the detection of nano-objects release, irrespective of its causes, from surgical masks, surgical respirator masks and barrier face coverings [reusable (regardless of washing characteristics) and disposable types] containing nano-objects, irrespective of the type of production technology.
| Committee |
DS/S-418
|
| DocumentType |
Technical Specification
|
| ProductNote |
This standard also identical to ISO/TS 11353:2026
|
| PublisherName |
Danish Standards
|
| Status |
Current
|
| ISO/TS 23302:2021 | Nanotechnologies — Requirements and recommendations for the identification of measurands that characterise nano-objects and materials that contain them |
| ISO 19749:2021 | Nanotechnologies — Measurements of particle size and shape distributions by scanning electron microscopy |
| ISO/TR 18196:2016 | Nanotechnologies — Measurement technique matrix for the characterization of nano-objects |
| ISO 20579-3:2021 | Surface chemical analysis — Sample handling, preparation and mounting — Part 3: Biomaterials |
| ISO 14887:2000 | Sample preparation — Dispersing procedures for powders in liquids |
| ISO/TS 24597:2011 | Microbeam analysis — Scanning electron microscopy — Methods of evaluating image sharpness |
| ISO 20579-4:2018 | Surface chemical analysis — Guidelines to sample handling, preparation and mounting — Part 4: Reporting information related to the history, preparation, handling and mounting of nano-objects prior to surface analysis |
| ISO/TS 21362:2018 | Nanotechnologies — Analysis of nano-objects using asymmetrical-flow and centrifugal field-flow fractionation |
| ISO 18114:2021 | Surface chemical analysis — Secondary-ion mass spectrometry — Determination of relative sensitivity factors from ion-implanted reference materials |
| ISO 29464:2011 | Cleaning equipment for air and other gases — Terminology |
| ISO/TR 14187:2020 | Surface chemical analysis — Characterization of nanostructured materials |
| ISO/TS 80004-6:2021 | Nanotechnologies — Vocabulary — Part 6: Nano-object characterization |
| ISO/TS 19590:2024 | Nanotechnologies — Characterization of nano-objects using single particle inductively coupled plasma mass spectrometry |
| ISO 13095:2014 | Surface Chemical Analysis — Atomic force microscopy — Procedure for in situ characterization of AFM probe shank profile used for nanostructure measurement |
| ISO/TS 18507:2015 | Surface chemical analysis — Use of Total Reflection X-ray Fluorescence spectroscopy in biological and environmental analysis |
| ISO 14706:2000 | Surface chemical analysis — Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy |
| ISO 27891:2015 | Aerosol particle number concentration — Calibration of condensation particle counters |
| ISO 16890-2:2022 | Air filters for general ventilation — Part 2: Measurement of fractional efficiency and air flow resistance |
| ISO 16531:2020 | Surface chemical analysis — Depth profiling — Methods for ion beam alignment and the associated measurement of current or current density for depth profiling in AES and XPS |
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