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DS/ISO/TS 11353:2026

Current

Current

The latest, up-to-date edition.

Nanotechnologies – A test method for detection of nano-object(s) release from mask media

Published date

20-01-2026

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This document specifies a test method for the detection of nano-objects release, irrespective of its causes, from surgical masks, surgical respirator masks and barrier face coverings [reusable (regardless of washing characteristics) and disposable types] containing nano-objects, irrespective of the type of production technology.

Committee
DS/S-418
DocumentType
Technical Specification
ProductNote
This standard also identical to ISO/TS 11353:2026
PublisherName
Danish Standards
Status
Current

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ISO/TR 18196:2016 Nanotechnologies — Measurement technique matrix for the characterization of nano-objects
ISO 20579-3:2021 Surface chemical analysis — Sample handling, preparation and mounting — Part 3: Biomaterials
ISO 14887:2000 Sample preparation — Dispersing procedures for powders in liquids
ISO/TS 24597:2011 Microbeam analysis — Scanning electron microscopy — Methods of evaluating image sharpness
ISO 20579-4:2018 Surface chemical analysis — Guidelines to sample handling, preparation and mounting — Part 4: Reporting information related to the history, preparation, handling and mounting of nano-objects prior to surface analysis
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ISO 18114:2021 Surface chemical analysis — Secondary-ion mass spectrometry — Determination of relative sensitivity factors from ion-implanted reference materials
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ISO/TS 80004-6:2021 Nanotechnologies — Vocabulary — Part 6: Nano-object characterization
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ISO 13095:2014 Surface Chemical Analysis — Atomic force microscopy — Procedure for in situ characterization of AFM probe shank profile used for nanostructure measurement
ISO/TS 18507:2015 Surface chemical analysis — Use of Total Reflection X-ray Fluorescence spectroscopy in biological and environmental analysis
ISO 14706:2000 Surface chemical analysis — Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy
ISO 27891:2015 Aerosol particle number concentration — Calibration of condensation particle counters
ISO 16890-2:2022 Air filters for general ventilation — Part 2: Measurement of fractional efficiency and air flow resistance
ISO 16531:2020 Surface chemical analysis — Depth profiling — Methods for ion beam alignment and the associated measurement of current or current density for depth profiling in AES and XPS

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