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DSCC 01517G:2022

DSCC 01517G:2022

Current

Current

The latest, up-to-date edition.

MICROCIRCUIT, MEMORY, DIGITAL, CMOS, RADIATION-HARDENED, 3.3 V, 32K X 8-BIT PROM, MONOLITHIC SILICON

Published date

08-12-2022

Publisher

Defense Supply Centre Columbus

This drawing documents two product assurance class levels consisting of high reliability (device class Q and M) and space application (device class V).

DocumentType
Standard
PublisherName
Defense Supply Centre Columbus
Status
Current
Supersedes

MIL-STD-1835 Revision C:2000 ELECTRONIC COMPONENT CASE OUTLINES
MIL-STD-883 Revision K:2016 TEST METHOD STANDARD - MICROCIRCUITS
JEDEC JESD78F:2022 IC Latch-Up Test
ASTM F 1192 : 2011 Standard Guide for the Measurement of Single Event Phenomena (SEP) Induced by Heavy Ion Irradiation of Semiconductor Devices
MIL-HDBK-103 Revision AV:2016 LIST OF STANDARD MICROCIRCUIT DRAWINGS
MIL-HDBK-780 Revision D:2004 STANDARD MICROCIRCUIT DRAWINGS
MIL-PRF-38535 Revision K:2013 Integrated Circuits (Microcircuits) Manufacturing, General Specification for

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