MICROCIRCUIT, DIGITAL, RADIATION HARDENED, LOW VOLTAGE CMOS, MINIMUM SKEW ONE-TO-EIGHT CLOCK DRIVER, LVTTL COMPATIBLE INPUTS AND OUTPUTS, MONOLITHIC SILICON

Published date

20-04-2023

Publisher

This drawing documents two product assurance class levels consisting of high reliability (device class Q) and space application (device class V).

DocumentType	Standard
PublisherName	Defense Supply Centre Columbus
Status	Current

MIL-STD-883 Revision K:2016	TEST METHOD STANDARD - MICROCIRCUITS
JEDEC JESD78F:2022	IC Latch-Up Test
MIL-HDBK-103 Revision AW:2016	LIST OF STANDARD MICROCIRCUIT DRAWINGS
ASTM F 1192 : 2011	Standard Guide for the Measurement of Single Event Phenomena (SEP) Induced by Heavy Ion Irradiation of Semiconductor Devices
MIL-PRF-38535 Revision J:2010	Integrated Circuits (Microcircuits) Manufacturing, General Specification for
MIL-HDBK-780 Revision D:2004	STANDARD MICROCIRCUIT DRAWINGS
MIL-STD-1835 Revision D:2004	ELECTRONIC COMPONENT CASE OUTLINES

Sorry this product is not available in your region.

Access your standards online with a subscription

Features

DSCC 06233D:2023