DSCC 07235B:2023
Current
Current
The latest, up-to-date edition.
MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 128K x 16-BIT (2M), STATIC RANDOM ACCESS MEMORY (SRAM), (3.3 V), MONOLITHIC SILICON
Published date
15-12-2023
Publisher
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This drawing documents two product assurance class levels consisting of high reliability (device class Q) and space application (device class V).
| DocumentType |
Standard
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| PublisherName |
Defense Supply Centre Columbus
|
| Status |
Current
|
| JEDEC JESD78F:2022 | IC Latch-Up Test |
| ASTM F 1192 : 2011 : R2018 | Standard Guide for the Measurement of Single Event Phenomena (SEP) Induced by Heavy Ion Irradiation of Semiconductor Devices |
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