DSCC 08243C:2025
Current
Current
The latest, up-to-date edition.
MICROCIRCUIT, DIGITAL, CMOS, RADIATION HARDENED, CLOCK NETWORK MANAGER, MONOLITHIC SILICON
Published date
27-06-2025
Publisher
Sorry this product is not available in your region.
This drawing documents two product assurance class levels consisting of high reliability device class Q and space application device class V.
| DocumentType |
Revision
|
| PublisherName |
Defense Supply Centre Columbus
|
| Status |
Current
|
| Supersedes |
| ASTM F 1192 : 2024 | Standard Guide for the Measurement of Single Event Phenomena (SEP) Induced by Heavy Ion Irradiation of Semiconductor Devices |
Summarise
Access your standards online with a subscription
-
Simple online access to standards, technical information and regulations.
-
Critical updates of standards and customisable alerts and notifications.
-
Multi-user online standards collection: secure, flexible and cost effective.
Sorry this product is not available in your region.