DSCC 11202D:2025
Current
Current
The latest, up-to-date edition.
MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 2M X 36-bit, 1.8 VOLT, 2-WORD AND 4-WORD BURST, RADIATION HARDENED, SYNCHRONOUS STATIC RANDOM ACCESS MEMORY (SSRAM), MONOLITHIC SILICON
Published date
01-10-2025
Publisher
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This drawing documents two product assurance class levels consisting of high reliability (device class Q) and space application (device class V).
| DocumentType |
Standard
|
| ProductNote |
This standard is refers to MIL-HDBK-10
|
| PublisherName |
Defense Supply Centre Columbus
|
| Status |
Current
|
| JEDEC JESD 78:1997 | IC LATCH-UP TEST |
| MIL-STD-883 Revision K:2016 | Microcircuits |
| ASTM F 1192 : 2024 | Standard Guide for the Measurement of Single Event Phenomena (SEP) Induced by Heavy Ion Irradiation of Semiconductor Devices |
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