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DSCC 13212D:2026

Current

Current

The latest, up-to-date edition.

MICROCIRCUIT, MEMORY, DIGITAL, CMOS/SOI, 16MBIT, RADIATION-HARDENED, NONVOLATILE RANDOM ACCESS MEMORY (NVRAM), MONOLITHIC SILICON

Published date

18-03-2026

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This drawing documents two product assurance class levels consisting of high reliability (device class Q) and space application (device class V).

DocumentType
Revision
PublisherName
Defense Supply Centre Columbus
Status
Current
Supersedes

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