• There are no items in your cart

DSCC 14227B:2023

Current

Current

The latest, up-to-date edition.

MICROCIRCUIT, DIGITAL-LINEAR, 14 BIT, 125 MSPS ANALOG TO DIGITAL CONVERTER, MONOLITHIC SILICON

Published date

01-10-2023

This drawing documents two product assurance class levels consisting of high reliability (device class Q) and space application (device class V).

DocumentType
Standard
PublisherName
Defense Supply Centre Columbus
Status
Current

ASTM F 1192 : 2011 : R2018 Standard Guide for the Measurement of Single Event Phenomena (SEP) Induced by Heavy Ion Irradiation of Semiconductor Devices

View more information
Sorry this product is not available in your region.

Access your standards online with a subscription

Features

  • Simple online access to standards, technical information and regulations.

  • Critical updates of standards and customisable alerts and notifications.

  • Multi-user online standards collection: secure, flexible and cost effective.