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DSCC 14227B:2023

Current

Current

The latest, up-to-date edition.

MICROCIRCUIT, DIGITAL-LINEAR, 14 BIT, 125 MSPS ANALOG TO DIGITAL CONVERTER, MONOLITHIC SILICON

Published date

01-10-2023

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This drawing documents two product assurance class levels consisting of high reliability (device class Q) and space application (device class V).

DocumentType
Standard
PublisherName
Defense Supply Centre Columbus
Status
Current

ASTM F 1192 : 2011 : R2018 Standard Guide for the Measurement of Single Event Phenomena (SEP) Induced by Heavy Ion Irradiation of Semiconductor Devices

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