DSCC 17237A:2023
Current
Current
The latest, up-to-date edition.
MICROCIRCUIT, BiCMOS, RADIATION HARDENED, ULTRA LOW NOISE, DUAL LOOP CLOCK JITTER CLEANER, MONOLITHIC SILICON
Published date
07-06-2023
Publisher
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This drawing documents two product assurance class levels consisting of high reliability (device class Q) and space application (device class V)
| DocumentType |
Standard
|
| PublisherName |
Defense Supply Centre Columbus
|
| Status |
Current
|
| Supersedes |
| ASTM F 1192 : 2011 | Standard Guide for the Measurement of Single Event Phenomena (SEP) Induced by Heavy Ion Irradiation of Semiconductor Devices |
| ANSI/ESDA/JEDEC JS-001:2017 | ESDA/JEDEC Joint Standard for Electrostatic Discharge Sensitivity Testing - Human Body Model (HBM) - Component Level<br> |
| JEDEC JEP 155B:2018 | RECOMMENDED ESD TARGET LEVELS FOR HBM/MM QUALIFICATION |
| MIL-PRF-38535 Revision L:2018 | Integrated Circuits (Microcircuits) Manufacturing, General Specification for |
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