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DSCC 17237A:2023

DSCC 17237A:2023

Current

Current

The latest, up-to-date edition.

MICROCIRCUIT, BiCMOS, RADIATION HARDENED, ULTRA LOW NOISE, DUAL LOOP CLOCK JITTER CLEANER, MONOLITHIC SILICON

Published date

07-06-2023

Publisher

Defense Supply Centre Columbus

This drawing documents two product assurance class levels consisting of high reliability (device class Q) and space application (device class V)

DocumentType
Standard
PublisherName
Defense Supply Centre Columbus
Status
Current
Supersedes

ASTM F 1192 : 2011 Standard Guide for the Measurement of Single Event Phenomena (SEP) Induced by Heavy Ion Irradiation of Semiconductor Devices
ANSI/ESDA/JEDEC JS-001:2017 ESDA/JEDEC Joint Standard for Electrostatic Discharge Sensitivity Testing - Human Body Model (HBM) - Component Level<br>
JEDEC JEP 155B:2018 RECOMMENDED ESD TARGET LEVELS FOR HBM/MM QUALIFICATION
MIL-PRF-38535 Revision L:2018 Integrated Circuits (Microcircuits) Manufacturing, General Specification for

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