DSCC 18209C:2025
Current
Current
The latest, up-to-date edition.
MICROCIRCUIT, DIGITAL-LINEAR, 12 BIT, RF SAMPLING, ANALOG TO DIGITAL CONVERTER, MONOLITHIC SILICON
Published date
19-03-2025
Publisher
Sorry this product is not available in your region.
This drawing documents two product assurance class levels consisting of high reliability (device class Q) and space application (device class V).
| DocumentType |
Standard
|
| PublisherName |
Defense Supply Centre Columbus
|
| Status |
Current
|
| Supersedes |
| JEDEC JESD 204:2017 | SERIAL INTERFACE FOR DATA CONVERTERS |
| ASTM F 1192 : 2024 | Standard Guide for the Measurement of Single Event Phenomena (SEP) Induced by Heavy Ion Irradiation of Semiconductor Devices |
| JEDEC JEP155:2008 | RECOMMENDED ESD TARGET LEVELS FOR HBM/MM QUALIFICATION |
| MIL-STD-883 Revision L:2019 | Microcircuits |
| JEDEC JEP 157 : 2009 | RECOMMENDED ESD-CDM TARGET LEVELS |
Summarise
Sorry this product is not available in your region.