DSCC 18209C:2025
Current
Current
The latest, up-to-date edition.
MICROCIRCUIT, DIGITAL-LINEAR, 12 BIT, RF SAMPLING, ANALOG TO DIGITAL CONVERTER, MONOLITHIC SILICON
Published date
19-03-2025
Publisher
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This drawing documents two product assurance class levels consisting of high reliability (device class Q) and space application (device class V).
| DocumentType |
Standard
|
| PublisherName |
Defense Supply Centre Columbus
|
| Status |
Current
|
| Supersedes |
| JEDEC JESD 204:2017 | SERIAL INTERFACE FOR DATA CONVERTERS |
| ASTM F 1192 : 2024 | Standard Guide for the Measurement of Single Event Phenomena (SEP) Induced by Heavy Ion Irradiation of Semiconductor Devices |
| JEDEC JEP155:2008 | RECOMMENDED ESD TARGET LEVELS FOR HBM/MM QUALIFICATION |
| MIL-STD-883 Revision L:2019 | Microcircuits |
| JEDEC JEP 157 : 2009 | RECOMMENDED ESD-CDM TARGET LEVELS |
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