DSCC 20207:2020
Superseded
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
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MICROCIRCUIT, CMOS, RADIATION HARDENED, CRYSTAL OSCILLATOR DRIVER AND DIVIDER, MONOLITHIC SILICON
Published date
04-05-2020
Publisher
Superseded date
27-02-2026
Superseded by
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This drawing documents two product assurance class levels consisting of high reliability (device class Q) and space application (device class V).
| DocumentType |
Standard
|
| PublisherName |
Defense Supply Centre Columbus
|
| Status |
Superseded
|
| SupersededBy |
| JEDEC JEP 163:2015 | Selection of Burn-In/Life Test Conditions and Critical Parameters for QML Microcircuits |
| ASTM F 1192 : 2011 | Standard Guide for the Measurement of Single Event Phenomena (SEP) Induced by Heavy Ion Irradiation of Semiconductor Devices |
| ANSI/ESDA/JEDEC JS-001:2017 | ESDA/JEDEC Joint Standard for Electrostatic Discharge Sensitivity Testing - Human Body Model (HBM) - Component Level<br> |
| MIL-STD-883 Revision L:2019 | Microcircuits |
| MIL-HDBK-780 Revision D:2004 | Standard Microcircuit Drawings |
| MIL-PRF-38535 Revision H:2007 | Integrated Circuits (Microcircuits) Manufacturing, General Specification for |
Summarise
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