DSCC 22210:2023
Current
Current
The latest, up-to-date edition.
MICROCIRCUIT, MEMORY, DIGITAL, CMOS, LOW POWER REPROGRAMMABLE 481,000 LOGIC ELEMENT FLASH FIELD PROGRAMMABLE GATE ARRAY WITH DECOUPLING CAPACITORS, FLIP CHIP Pb FREE BUMP, MONOLITHIC SILICON
Published date
01-09-2023
Publisher
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This drawing documents two product assurance class levels consisting of high reliability (device class Q) and space application (device class V).
| DocumentType |
Standard
|
| ProductNote |
This standard also refers to J-STD-002, MIL-STD-883
|
| PublisherName |
Defense Supply Centre Columbus
|
| Status |
Current
|
| JEDEC JESD78F:2022 | IC Latch-Up Test |
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