DSCC 25205:2025
Current
Current
The latest, up-to-date edition.
MICROCIRCUIT, DIGITAL CMOS, RADIATION HARDENED, 2.5 V QUAD LVDS DRIVER, MONOLITHIC SILICON
Published date
10-12-2025
Publisher
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This drawing documents two product assurance class levels consisting of high reliability (device class Q) and space application (device class V).
| DocumentType |
Standard
|
| ProductNote |
This standard also refers to JEDEC PUB 95
|
| PublisherName |
Defense Supply Centre Columbus
|
| Status |
Current
|
| JEDEC JEP 163:2015 | Selection of Burn-In/Life Test Conditions and Critical Parameters for QML Microcircuits |
| MIL-STD-883 Revision L:2019 | Microcircuits |
| ANSI/ESDA/JEDEC JS-001:2024 | JOINT JEDEC/ESDA STANDARD FOR ELECTROSTATIC DISCHARGE SENSITIVITY TEST - HUMAN BODY MODEL (HBM) - DEVICE LEVEL |
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Sorry this product is not available in your region.