DSCC 88706J:2023-10
Current
Current
The latest, up-to-date edition.
MICROCIRCUIT, DIGITAL, ADVANCED CMOS, RADIATION HARDENED, OCTAL BUFFER / LINE DRIVER WITH THREE-STATE OUTPUTS, MONOLITHIC SILICON
Published date
24-10-2023
Publisher
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This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V).
| DocumentType |
Standard
|
| PublisherName |
Defense Supply Centre Columbus
|
| Status |
Current
|
| Supersedes |
| ASTM F 1192 : 2011 | Standard Guide for the Measurement of Single Event Phenomena (SEP) Induced by Heavy Ion Irradiation of Semiconductor Devices |
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