DSCC 89598M : 2019
Superseded
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
View Superseded by
MEMORY, DIGITAL, CMOS, 128K X 8 STATIC RANDOM ACCESS MEMORY (SRAM) LOW POWER, MONOLITHIC SILICON
Published date
16-07-2019
Publisher
Superseded date
29-04-2025
Superseded by
Sorry this product is not available in your region.
This drawing documents two product assurance class levels consisting of high reliability (device class Q and M) and space application (device class V).
| DocumentType |
Standard
|
| ProductNote |
THIS STANDARD IS ALSO REFERES TO :JESD 78
|
| PublisherName |
Defense Supply Centre Columbus
|
| Status |
Superseded
|
| SupersededBy |
| MIL-STD-1835 Revision C:2000 | Electronic Component Case Outlines |
| MIL-HDBK-103 Revision AA:2007 | List of Standard Microcircuit Drawings |
| ASTM F 1192 : 2011 | Standard Guide for the Measurement of Single Event Phenomena (SEP) Induced by Heavy Ion Irradiation of Semiconductor Devices |
| MIL-HDBK-780 Revision D:2004 | Standard Microcircuit Drawings |
| MIL-STD-883 Revision E:1996 | Microcircuits |
| MIL-PRF-38535 Revision F:2002 | Integrated Circuits (Microcircuits) Manufacturing, General Specification for |
Summarise
Access your standards online with a subscription
-
Simple online access to standards, technical information and regulations.
-
Critical updates of standards and customisable alerts and notifications.
-
Multi-user online standards collection: secure, flexible and cost effective.
Sorry this product is not available in your region.