• There are no items in your cart

DSCC 89764D:2023

Current

Current

The latest, up-to-date edition.

MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 4K X 8 DUAL PORT STATIC RANDOM ACCESS MEMORY, MONOLITHIC SILICON

Published date

22-06-2023

This drawing documents two product assurance class levels consisting of high reliability (device class Q and M) and space application (device class V).

DocumentType
Standard
PublisherName
Defense Supply Centre Columbus
Status
Current

JEDEC JESD78F:2022 IC Latch-Up Test
ASTM F 1192 : 2011 Standard Guide for the Measurement of Single Event Phenomena (SEP) Induced by Heavy Ion Irradiation of Semiconductor Devices
MIL-PRF-38535 Revision L:2018 Integrated Circuits (Microcircuits) Manufacturing, General Specification for

View more information
Sorry this product is not available in your region.

Access your standards online with a subscription

Features

  • Simple online access to standards, technical information and regulations.

  • Critical updates of standards and customisable alerts and notifications.

  • Multi-user online standards collection: secure, flexible and cost effective.