DSCC 91576F:2025
Current
Current
The latest, up-to-date edition.
MICROCIRCUIT, DIGITAL, 8-BIT CHMOS MICROCONTROLLER WITH 8K BYTES EPROM MEMORY, MONOLITHIC SILICON
Published date
12-12-2025
Publisher
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This drawing documents three product assurance class levels consisting of high reliability (device classes Q and
M), space application (device class V), and nontraditional performance environment (device class N).
| DocumentType |
Revision
|
| PublisherName |
Defense Supply Centre Columbus
|
| Status |
Current
|
| Supersedes |
| JEDEC JESD 78:1997 | IC LATCH-UP TEST |
| ASTM F 1192 : 2024 | Standard Guide for the Measurement of Single Event Phenomena (SEP) Induced by Heavy Ion Irradiation of Semiconductor Devices |
| MIL-STD-883 Revision L:2019 | Microcircuits |
| MIL-HDBK-780 Revision D:2004 | Standard Microcircuit Drawings |
| MIL-PRF-38535 Revision L:2018 | Integrated Circuits (Microcircuits) Manufacturing, General Specification for |
| MIL-STD-1835 Revision D:2004 | Electronic Component Case Outlines |
Summarise
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