DSCC 91727E:2026
Current
Current
The latest, up-to-date edition.
Microcircuit, Digital, Bipolar CMOS, Scan Test Device with Octal D-Type Edge Triggered Flip-Flop, Three-State Outputs, TTL Compatible Inputs, Monolithic Silicon
Published date
19-03-2026
Publisher
Sorry this product is not available in your region.
This drawing documents two product assurance class levels consisting of high reliability (device class Q) and space application (device class V).
| DocumentType |
Standard
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| PublisherName |
Defense Supply Centre Columbus
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| Status |
Current
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| Supersedes |
Summarise
Sorry this product is not available in your region.