DSCC 92174F:2021
Current
Current
The latest, up-to-date edition.
Microcircuit, Digital, Advanced CMOS, 1-to-8 Minimum Skew Clock Driver, Monolithic Silicon
Published date
17-08-2021
Publisher
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This drawing documents two product assurance class levels consisting of high reliability (device class Q and M) and space application (device class V.
| DocumentType |
Standard
|
| PublisherName |
Defense Supply Centre Columbus
|
| Status |
Current
|
| Supersedes |
| JEDEC JESD 78:1997 | IC LATCH-UP TEST |
| ASTM F 1192 : 2024 | Standard Guide for the Measurement of Single Event Phenomena (SEP) Induced by Heavy Ion Irradiation of Semiconductor Devices |
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