DSCC 93118E:2024
Current
Current
The latest, up-to-date edition.
MICROCIRCUIT, DIGITAL, ADVANCED CMOS, SERIALLY CONTROLLED ACCESS NETWORK, TRANSPARENT LATCH WITH THREE-STATE OUTPUTS, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
Published date
17-01-2024
Publisher
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This drawing documents two product assurance class levels consisting of high reliability (device class Q and M) and space application (device class V).
| DocumentType |
Standard
|
| PublisherName |
Defense Supply Centre Columbus
|
| Status |
Current
|
| IEEE 1149.1-2001 | IEEE Standard Test Access Port and Boundary Scan Architecture |
| MIL-HDBK-103 Revision BH:2021 | List of Standard Microcircuit Drawings |
| MIL-STD-883-5 Base Document:2019 | Test Procedures for Microcircuits Part 5: Test Methods 5000-5999 |
| MIL-STD-883-3 Base Document:2019 | Electrical Tests (Digital) for Microcircuits Part 3: Test Methods 3000-3999 |
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