DSCC 93118E:2024
Current
Current
The latest, up-to-date edition.
MICROCIRCUIT, DIGITAL, ADVANCED CMOS, SERIALLY CONTROLLED ACCESS NETWORK, TRANSPARENT LATCH WITH THREE-STATE OUTPUTS, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
Published date
17-01-2024
Publisher
Sorry this product is not available in your region.
This drawing documents two product assurance class levels consisting of high reliability (device class Q and M) and space application (device class V).
| DocumentType |
Standard
|
| PublisherName |
Defense Supply Centre Columbus
|
| Status |
Current
|
| IEEE 1149.1-2001 | IEEE Standard Test Access Port and Boundary Scan Architecture |
Access your standards online with a subscription
Features
-
Simple online access to standards, technical information and regulations.
-
Critical updates of standards and customisable alerts and notifications.
-
Multi-user online standards collection: secure, flexible and cost effective.