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DSCC 93118E:2024

Current

Current

The latest, up-to-date edition.

MICROCIRCUIT, DIGITAL, ADVANCED CMOS, SERIALLY CONTROLLED ACCESS NETWORK, TRANSPARENT LATCH WITH THREE-STATE OUTPUTS, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON

Published date

17-01-2024

This drawing documents two product assurance class levels consisting of high reliability (device class Q and M) and space application (device class V).

DocumentType
Standard
PublisherName
Defense Supply Centre Columbus
Status
Current

IEEE 1149.1-2001 IEEE Standard Test Access Port and Boundary Scan Architecture

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