DSCC 94672C:2023
Current
Current
The latest, up-to-date edition.
MICROCIRCUIT, DIGITAL, ADVANCED BIPOLAR CMOS, SCAN TEST DEVICE WITH 18-BIT UNIVERSAL BUS TRANSCEIVER, THREE-STATE OUTPUTS, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
Published date
25-10-2023
Publisher
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This drawing documents two product assurance class levels consisting of high reliability (device class Q) and space application (device class V).
| DocumentType |
Standard
|
| PublisherName |
Defense Supply Centre Columbus
|
| Status |
Current
|
| MIL-HDBK-103 Revision BK:2022 | List of Standard Microcircuit Drawings |
| MIL-STD-883-2 Change 1 (change incorporated):2022 | Mechanical Test Methods for Microcircuits Part 2: Test Methods 2000-2999 |
| MIL-PRF-38535 Revision M:2022 | Integrated Circuits (Microcircuits) Manufacturing, General Specification for |
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Sorry this product is not available in your region.