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DSCC 95652F:2023

Current

Current

The latest, up-to-date edition.

MICROCIRCUIT, DIGITAL, RADIATION HARDENED, ADVANCED CMOS, TRIPLE AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 95-12-20 THREE-INPUT NAND GATE, MONOLITHIC SILICON

Published date

21-11-2023

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This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V).

DocumentType
Standard
PublisherName
Defense Supply Centre Columbus
Status
Current

ASTM F 1192 : 2011 Standard Guide for the Measurement of Single Event Phenomena (SEP) Induced by Heavy Ion Irradiation of Semiconductor Devices

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