DSCC 96529E : 2020
Superseded
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
View Superseded by
MICROCIRCUIT, DIGITAL, ADVANCED CMOS, RADIATION HARDENED, TRIPLE 3-INPUT NOR GATE, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
Published date
22-05-2020
Publisher
Superseded date
19-09-2025
Superseded by
Sorry this product is not available in your region.
This drawing documents two product assurance class levels consisting of high reliability (device class Q) and space application (device class V).
| DocumentType |
Standard
|
| PublisherName |
Defense Supply Centre Columbus
|
| Status |
Superseded
|
| SupersededBy |
| ASTM F 1192 : 2011 | Standard Guide for the Measurement of Single Event Phenomena (SEP) Induced by Heavy Ion Irradiation of Semiconductor Devices |
| JEDEC JESD 20:1990 | STANDARD FOR DESCRIPTION OF 54/74ACXXXXX AND 54/74ACTXXXXX ADVANCED HIGH-SPEED CMOS DEVICES: |
| MIL-STD-883 Revision L:2019 | Microcircuits |
| MIL-HDBK-780 Revision D:2004 | Standard Microcircuit Drawings |
| MIL-PRF-38535 Revision K:2013 | Integrated Circuits (Microcircuits) Manufacturing, General Specification for |
| MIL-STD-1835 Revision D:2004 | Electronic Component Case Outlines |
Summarise
Sorry this product is not available in your region.