DSCC 96533F:2026
Current
Current
The latest, up-to-date edition.
Microcircuit, Digital, Advanced CMOS, Radiation Hardened, 4-Wide 2-Input AND-OR-Invert Gate, TTL Compatible Inputs, Monolithic Silicon
Published date
23-02-2026
Publisher
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This drawing documents two product assurance class levels consisting of high reliability (device class Q) and space application (device class V).
| DocumentType |
Revision
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| PublisherName |
Defense Supply Centre Columbus
|
| Status |
Current
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| Supersedes |
| ASTM F 1192 : 2024 | Standard Guide for the Measurement of Single Event Phenomena (SEP) Induced by Heavy Ion Irradiation of Semiconductor Devices |
Summarise
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